Areas of Interest
- Micro (Nano) Electronic Devices: Electrical Characterization and Modeling of Semiconductor Devices, Non-Volatile Memories, Advanced MOSFET Reliability, MOS Device Fabrication, MEMS: Electro-mechanical Switches, Device Failure Mechanism, Photonics: Semiconductor Photonic Devices, Novel Photonic Devices
Honors and Awards
| Award | Institute | Year |
|---|---|---|
| DAAD-Fellowship [TU9-DAAD - IIT FACULTY EXCHANGE PROG.] | DAAD - GERMANY | 2014 |
| MHRD Seconded Visiting Faculty, AIT - Bangkok | MHRD - INDIA | 2015 |
Educational Details
| Degree | Subject | University | Year |
|---|---|---|---|
| Ph.D. | Microelectronics | IIT - Bombay | 2010 |
Sponsored Research Projects
| Topic | Funding Agency | Start Date | Period |
|---|---|---|---|
| HKMG-DEVICES CHARACTERIZATION & MODELING | FIG - IITR [PI] | 2014-03 | 3 years |
| HKMG-DEVICES RELIABILITY | SERB-DST [PI] | 2014-07 | 3 years |
| NCFET: FABRICATION, CHARACTERIZATION & MODELING | DST (NANOMISSION/NT) [PI] | 2019-02 | 3 years |
| TIME RESOLVED SPECTROSCOPY (SMILE ) | MHRD/IIT-R [Co-PI] | 2019-01 | 5 years |
| MATCHING GRANT SCHEME | SRIC - IIT-R [PI] | 2019-02 | 3 years |
| INVESTIGATION ON ATOMIC SWITCH | SERB - CRG [PI] | 2021-04 | 3 years |
Participation in seminars
| Name | Place | Sponsored By | Date |
|---|---|---|---|
| [PANELIST] ELECTRONICS & SEMICON. TECH. (NANOSCALE TRANSISTORS & MEMORY DEVICES), VAIBHAV SUMMIT, GOVT. OF INDIA | ONLINE | GOI | 2020-10 |
Teaching Engagements
| Title | Course Code | Class Name | Semester |
|---|---|---|---|
| INTRODUCTION TO ELECTRONICS | EE - 21004 | UG [IIT - JODHPUR] | Autumn |
| DIGITAL DESIGN | EC - 104 | UG [TUTORIAL] | Spring |
| DIGITAL CIRCUITS LAB. | ECN - 252 | UG [CSE] | Spring |
| SEMICONDUCTOR DEVICES & TECHNOLOGY | EC - 242 | UG | Spring |
| ELECTRONIC NETWORK THEORY | ECN - 291 | UG | Autumn |
| B.Tech. LAB BASED PROJECT (COORDINATOR/MEV) | ECN - 300 | UG | Spring |
| MICROELECTRONIC DEVICES, TECHNOLOGY & CIRCUITS | PEC - 341 | UG | Autumn |
| FUNDAMENTALS OF MICROELECTRONICS | EC - 344 | UG | Spring |
| LINEAR IC APPLICATIONS LAB. | PEC - 361 | UG | Autumn |
| MOS DEVICE PHYSICS & MODELING | EC - 546 | PG + PhD | Autumn |
| SEMICONDUCTOR DEVICE MODELING | ECN - 571 | PG + PhD | Autumn |
| MICROELECTRONICS LAB - I | ECN-575 | PG | Spring |
| VLSI TECHNOLOGY | ECN - 577 | PG + PhD | Spring |
Projects and Thesis Supervised
| Title of Project | Names of Students |
|---|---|
| MODERNIZATION OF UNDERGRADUATE LAB. (MUGL) (2019 - 20) | UG (MICRO-E. DEVICES, TECH. & CIRCUITS) |
PHDs Supervised
| Topic | Scholar Name | Status of PHD | Registration Date |
|---|---|---|---|
| PHOTONIC DEVICES | Mandeep Singh | A | 2014-01 |
| 1/f - NOISE | Deepak Kumar Sharma | A | 2016-01 |
| TFT | Rishabh Kishore | O | 2018-07 |
| NANOSCALE MOSFET | Vivek Kumar | O | 2018-07 |
| Neuromorphic Memory | Kavita Vishwakarma | O | 2018-07 |
| NCFET | Komal Mishra | O | 2019-07 |
| Microfabrication | Mandeep Kumar | O | 2019-07 |
Visits to outside institutions
| Institute Visited | Purpose of Visit | Date |
|---|---|---|
| UNISANTIS ELECTRONICS, TOKYO, JAPAN | INVITED | 2011-11-16 |
Invitations
| Topic | Organistaion | Date |
|---|---|---|
| [INVITED TALK] | SUMMER COLLOQUIUM, IHT-UNIVERSITY OF STUTTGART, GERMANY | 2014-05 |
| [INVITED TALK] | TU9, GERMANY - IIT - MANDI COLLABORATION WORKSHOP | 2014-09 |
| [INVITED TALK] | INDO-FRENCH WORKSHOP ON DEVICE MODELING, IISc BANGALORE | 2015-03 |
| [INVITED TALK] | UNIVERSITY OF MARYLAND, BALTIMORE COUNTY, USA | 2015-12 |
| [INVITED TALK] | INTL. CONF. ON EMERGING ELECTRONICS (ICEE - 2016), IIT - BOMBAY | 2016-12 |
| [INVITED TALK] | NATIONAL WORKSHOP ON POWER ELECTRONICS, IIT - ROORKEE, INDIA | 2017-10 |
Special Lectures Delivered
| Title | Place | Date |
|---|---|---|
| MOSC PHYSICS & CHARACTERIZATION | UNIVERSITY OF STUTTGART, GERMANY | 2014-05 |
| CMOS VLSI PROCESS TECHNOLOGY | E&ICT ACADEMY, MEITY-IIT - ROORKEE, INDIA | 2017-10 |
| EXPERT LECTURE | NIT - UTTARAKHAND, INDIA | 2017-11 |
| FACULTY DEVELOPMENT PROGRAM | C-DAC - MOHALI, INDIA | 2018-01 |
National International Collaboration
| Topic | Organisation |
|---|---|
| REVIEWER, PEARSON GLOBAL EDITIONS | PEARSON EDUCATION LTD., LONDON |
Refereed Journal Papers
[SELECTED]
A. Datta, P. Bharath Kumar, and S. Mahapatra, “Dual-bit/Cell SONOS Flash EEPROM: Impact of Channel Engineering on Programming Speed and Bit Coupling Effect,” IEEE – Electron Device Lett., 28 (5), pp. 446 – 48, 2007
A. Datta, R. Asnani, and S. Mahapatra, “A Novel Gate Assisted Reverse Read Scheme to Control Bit Coupling and Read Disturb for Multibit/Cell Operation in Deeply Scaled Split Gate SONOS Flash EEPROM Cells,” IEEE – Electron Device Lett., 30 (8), pp. 885 – 87, 2009
S. Ravindran, A. Datta, K. Alameh, and Y.T. Lee, “GaAs Based Long Wavelength Micro-ring Resonator Optical Switches Utilizing Bias Assisted Carrier Injection Induced Refractive Index Change,” OSA – OPTICS EXPRESS, 20 (14), pp. 15610 – 15627, 2012
J. Schulze, A. Blech, A. Datta, I. A. Fischer, D Hähnel, S. Naasz, E. Rolseth, and E-M. Tropper, “Vertical Ge and GeSn Heterojunction gate-all-around Tunneling Field Effect Transistors,” Selected Papers from 7th International SiGe Technology and Device Meeting (ISTDM 2014), Singapore, appeared in SOLID STATE ELECTRONICS (Special Issue), 110, pp. 59 – 64, 2015
S. Jagtiani, and A. Datta, “Impact of Dielectric Resistive Heater, Bottom Contact and Reading Scheme on the Reliability of Nanoscale Low Power Phase Change Memory (PCM) Cell: 3D-ADI Modeling,” IEEE - Trans. on Device and Materials Reliability, 16(2), pp. 149 - 157, 2016
B. Kashyap, and A. Datta, “Modelling and Analysis of Vertical P-N Junction, Graded Bandgap AlfGa1-fAs Rectangular-slab and Cylindrical Solar Cells on Elevated GaAs Ridge and Wire,” IEEE – Trans. on Electron Devices, 64 (6), pp. 2564 - 2571, 2017
M. Singh, and A. Datta, “Modeling of a Vertical Hybrid Plasmonic Switch with VO2 Fin Bragg Grating,” IEEE - PHOTONICS Tech. Lett., 30 (11), pp. 997 - 1000, 2018
D. K. Sharma, and A. Datta, "Impact of Varying Strain Energy in Oxide on Random Telegraph Noise and Associated Time Constants in Silicon Nanowire p-MOSFETs," IEEE - Trans. on Electron Devices, 66 (3), pp. 1489 - 1494, 2019
A. K. S. Chauhan, D. K. Sharma, and A. Datta, "Rate Limited Filament Formation in Al-ZnO-Al Bipolar ReRAM Cells and its Impact on Early Current Window Closure during Cycling," J. APPLIED PHYSICS, 125 (104503), 2019
M. Singh, and A. Datta, "LSPR Excitation on Au Nanorings from Integrated Hybrid Plasmonic Aperture Waveguide and its Application in Methanol Detection in the IR-band," IEEE - SENSORS J., 19(15), pp. 6119 - 6125, 2019
D. K. Sharma, R. Goud, A. Datta, and S. Manhas, "Field Stress Influenced Conduction Behavior of Narrow Diameter Gate-All-Around (GAA) Silicon Nanowire n-MOSFET," IEEE/TMS - J. ELECTRON. MAT., 48 (12), pp. 7674 - 7679, 2019
D. K. Sharma, and A. Datta, "Oxide Edge Trap Density Extraction in Silicon Nanowire MOSFET from Tunnel Current Noise Measurement in Gated Diode like Arrangement," IEEE - Trans. on Device and Materials Reliability, 20 (3), pp. 512 - 516, 2020
K. Vishwakarma, R. Kishore, and A. Datta, "Symmetric Linear Rise and Fall of Conductance in a Tri-layer Stack Engineered ReRAM based Synapse," ACS - APPLIED ELECTRON. MATERIALS, 2, pp. 3263 - 3269, 2020
R. Kishore, K. Vishwakarma, and A. Datta, "Sub-Pico-Second Hole Generation Lifetime in Thin Film IGZO Sputtered and Annealed on p-Silicon Substrate," IEEE - Trans. on Nano-Tech., 20, 9423600, pp. 392 - 399, 2021
R. Kishore, K. Vishwakarma, and A. Datta, "Impact of Bias Temperature Stress on IGZO/Ni/IGZO Steep Subthreshold Vertical Current Driver Fabricated at Room Temperature," IEEE - Trans. on Device and Materials Reliability, 21(2), pp. 273 - 278, 2021
K. Vishwakarma, R. Kishore, and A. Datta, "Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-layer ReRAM Cell: Electrical Characteristics and Reliability," IEEE - Trans. on Device and Materials Reliability, 2021
V. Kumar, S. Dasgupta and A. Datta, "A Thermal Circuit Representing Frequency Dependent Dynamic Heating between Electron and Lattice in SOI-FinFET," IEEE - Trans. on Device and Materials Reliability, 2021
R. Kishore, K. Vishwakarma, and A. Datta, "Impact of Nonuniform Ozone Anneal Treatment on the Resistance Levels in an IGZO-ReRAM Fabricated on ITO Coated Glass Substrate," IEEE - Trans. on Electron Devices, 2021
N. Chauhan, N. Bagga, S. Banchhor, A. Datta, S. Dasgupta, and A. Bulusu, "Negative to Positive Differential Resistance Transition in Ferroelectric FET: Physical Insight and Utilization in Analog Circuits," IEEE - Trans. on Ultrasonics, Ferroelectrics and Frequency Control, 2021
N. Chauhan, N. Bagga, S. Banchhor, C. Garg, A. Sharma, A. Datta, S. Dasgupta, and A. Bulusu, "BOX Engineering to Mitigate Negative Differential Resistance in MFIS Negative Capacitance FDSOI FET: An Analog Perspective," IoP - NANOTECHNOLOGY, 2021
[CONF.]
M. Singh, and A. Datta, “Modeling of CMOS Compatible Ring Resonator Switch with Intermediate Vanadium Oxide as the Switching Element,” 1953 (1), 060015, AIP – Conf. Proc., 2018
V. Kumar, N. Chauhan, A. Datta, and S. Dasgupta, "Optimization of Negative Differential Conductance (NDC) Point for Multi Gate Devices Considering Self Heating Effects using Surface to Volume Ratio (SVR)," XXI International Workshop on Physics of Semiconductor Devices (IWPSD), IIT - Delhi & SSPL - Delhi, 2021
R. Kishore, K. Vishwakarma, and A. Datta, "Effect of Non-identical Annealing on the Breakdown Characteristics of Sputtered IGZO Films," in IEEE - International Reliability Physics Symposium (IRPS), Dallas, Texas, USA, 2022
N. Chauhan, C. Garg, Kai Ni, A. Behera, S. Yadav, S. Banchhor, N. Bagga, A. Dasgupta, A. Datta, S. Dasgupta and A. Bulusu, "Impact of Random Spatial Fluctuation in Non-uniform Crystalline Phases on Multi-domain MFIM Capacitor and Negative Capacitance FDSOI," in IEEE - International Reliability Physics Symposium (IRPS), Dallas, Texas, USA, 2022
